Nanometer Axial Resolution by Three-Dimensional Supercritical Angle Fluorescence Microscopy
نویسندگان
چکیده
منابع مشابه
Nanometer axial resolution by three-dimensional supercritical angle fluorescence microscopy.
We report a noninvasive fluorescence microscopy method and demonstrate nanometer resolution along the optical axis. The technique is based on the influence of the microscope slide on the angular intensity distribution of fluorescence. Axial positions are determined by measuring the proportion of light emitted below the critical angle of total internal reflection, which behaves in a classical wa...
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ژورنال
عنوان ژورنال: Physical Review Letters
سال: 2010
ISSN: 0031-9007,1079-7114
DOI: 10.1103/physrevlett.105.108103